Uncompromised characterization of all types of materials at the nanoscale
Ideal for characterization of materials at low beam energies for maximum surface topography
Excellent imaging of beam-sensitive and non-conductive samples
Fully automated setup of electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
Intuitive live SEM navigation on the sample at magnification as low as 2× without the need of an extra optical navigation camera thanks to the Wide Field Optics™ design
Unique In-Beam Multidetector design allowing angle and energy selective BSE detection
Intuitive software modular platform designed for effortless operation regardless of users’ skill level
Ti Nanotubes
Nanoporous gold on Si
Interlamellar spacing in perlite of cast iron
TESCAN Webinar:
Leveraging Advanced UHR-SEM Contrast Methods Using TESCAN CLARA’s In-column Detectors
