Field-free analytical UHR SEM for materials characterization at the nanoscale

  • Uncompromised characterization of all types of materials at the nanoscale
  • Ideal for characterization of materials at low beam energies for maximum surface topography
  • Excellent imaging of beam-sensitive and non-conductive samples
  • Fully automated setup of electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™
  • Intuitive live SEM navigation on the sample at magnification as low as 2× without the need of an extra optical navigation camera thanks to the Wide Field Optics™ design
  • Unique In-Beam Multidetector design allowing angle and energy selective BSE detection
  • Intuitive software modular platform designed for effortless operation regardless of users’ skill level

TESCAN Webinar:

Leveraging Advanced UHR-SEM Contrast Methods Using TESCAN CLARA’s In-column Detectors


    Product Brochure

    pdf 7 MB Download

    Product Flyer

    pdf 2 MB Download
  • TESCAN Wide Field Mode

    Product Flyer

    pdf 281 KB Download
  • TESCAN Esscence 3D Collision Model

    Product Flyer

    pdf 215 KB Download
  • Advanced BSE Detection Capabilities

    Application Note

    pdf 1 MB Download
  • SEM and EBSD analysis of the grain structure after ECAP process of the aluminum material

    Application Note

    pdf 745 KB Download
  • App note

    Analysis of ceramic nano-particles

    pdf 1 MB Download
  • App note

    Correlative SEM investigations using in-situ tensile testing and EBSD

    pdf 3 MB Download
Get in touch

Do you wish to discuss TESCAN CLARA? Contact our Team directly!