The integration of so many complementary analytical tools will allow researchers to characterize complex samples and solve analytical problems rapidly.
The LYRA GM can be configured with a variety of Focused Ion Beam sources and is the first in its class to integrate a Time of Flight secondary ion mass spectrometer (TOF-SIMS) and in situ Atomic Force Microscope (AFM).
The LYRA GM will be showcased next month, August 8th thru the 11th at the upcoming Microscopy and Microanalysis conference in Nashville, Tennessee.
LYRA3 GM – A multifunctional Tool for Nanotechnology
The Newest generation FIB-SEM workstation from TESCAN delivers state of the art integration of a best-in-class Focused Ion Beam column and Field Emission Scanning Electron Microscope, while integrating an unprecedented range of nano-structuring, imaging, and nano-analytical tools.