As pioneers of such things as the integrated ToF-SIMS, Xe plasma FIB-SEM and the Raman Integrated Scanning Electron (RISE) microscope, TESCAN continues to develop a suite of world-class imaging, modification and microanalytical instruments for the scientific community.
The revolutionary new TENSOR―the first 4D-scanning transmission electron microscope (4D-STEM) built from the ground up for a totally new level of performance and user experience. TENSOR is designed to address the needs of anyone with an interest in multimodal nano-characterization applications (morphological, chemical, and structural), including materials scientists, semiconductor R&D and failure analysis (FA) engineers, and crystallographers.
TESCAN’s leading-edge micro-CT systems facilitate image acquisition, 3D reconstruction, 3D visualization, and quantification. High-speed imaging also enables dynamic or 4D CT that can reveal structural changes over time as a function of changing variables e.g. load. TESCAN has solutions to cater to your technical requirements and budget.
1. SEM’s
2. FIB-SEM’s (Ga and Xe plasma)
3. 4D-STEM
4. micro-CT (Computed Tomography)
5. FIB-SEM Solutions for Materials Science
6. Product add-ons
With state-of-the-art optics, electronics and software married to optimized hardware, TESCAN brings you performance and versatility. This allows us to tailor systems to your specific requirements, as well as offering the flexibility to add more detectors down the track, thus futureproofing your investment. With various chamber sizes and variable pressure options, TESCAN’s systems can handle samples of almost any size and type