Wide field of view is a very much appreciated feature in scanning electron microscopy (SEM). Not only because of the possibility to provide images of large objects with high resolution and excellent topographical and material contrast but also in terms of sample navigation. The TESCAN S8000 allows obtaining an undistorted large field of view images that can be as large as up to tens of millimeters.
Do you want to know more? Please download the Application Example from the link below.