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TESCAN SEM Solutions for Materials Science

Scanning Electron Microscopy has become an essential tool for materials science and engineering. TESCAN offers an extended portfolio of turnkey systems, tailored to help scientists and researchers in materials science make progress and achieve their goals. TESCAN’s broad range of dedicated and innovative instruments is part of our firm commitment to push materials science forward.

TESCAN SEM Solutions for Materials Science

TESCAN VEGA

Analytical SEM for routine materials characterization, research and quality control applications at the micron scale

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TESCAN MIRA

High-resolution analytical SEM for routine materials characterization, research and quality control applications at the sub-micron scale

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TESCAN CLARA

Field-free analytical UHR SEM for materials characterization at nanoscale

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TESCAN MAGNA

UHR SEM for nanomaterials characterization at sub-nanometer scale

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