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TESCAN SEM Solutions for Materials Science

Scanning Electron Microscopy has become an essential tool for materials science and engineering. TESCAN offers an extended portfolio of turnkey systems, tailored to help scientists and researchers in materials science make progress and achieve their goals. TESCAN’s broad range of dedicated and innovative instruments is part of our firm commitment to push materials science forward.

TESCAN SEM Solutions for Materials Science

TESCAN VEGA3

High throughput analytical W-SEM for materials characterization at a micro scale

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TESCAN MIRA3

High throughput analytical FEG-SEM for materials characterization at sub-micron scale

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TESCAN CLARA

Field-free analytical UHR SEM for materials characterization at nanoscale

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TESCAN MAGNA

UHR SEM for nanomaterials characterization at sub-nanometer scale

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Do you wish to discuss TESCAN SEM Solutions for Materials Science? Contact our Product Team directly!